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Final Program


Cross-Disciplinary Symposia

C04.P1 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

(410) MC X-ray Coupled with Neural Networks for Element Quantification: A Neural Network-Enhanced Approach

Thursday, August 1, 2024
10:00 AM - 12:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • DG

    Dawei Gao (he/him/his)

    Mcgill University, Canada

    • Co-Author(s)

  • Yu Yuan

    Software developer
    Mcgill University, Canada

  • Raynald Gauvin

    Professor
    McGill University
    McGill University
    Montreal, Quebec, Canada

  • NP

    Nicolas Piché

    Vice President Research & Development
    Object Research Systems. Montreal, Canada.
    École de technologie supérieure
    Montreal, Quebec, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.