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Final Program


Cross-Disciplinary Symposia

C04.P1 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

(409) Machine Learning-Enhanced TEM Image Analysis Techniques

Thursday, August 1, 2024
10:00 AM - 12:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • KB

    Kamyar Barakati (he/him/his)

    The University of Tennessee, Knoxville, TN, United States

    • Co-Author(s)

  • XZ

    Xin Zhang

    Pacific Northwest National Laboratory, Richland, WA, United States, United States

  • XW

    Xiang Wang2

    Pacific Northwest National Laboratory, Richland, WA, United States, United States

  • SK

    Sergei Kalinin (he/him/his)

    Pacific Northwest National Laboratory, Richland, WA, United States, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.