262 Views

Cross-Disciplinary Symposia

C04.P1 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

(402) Automated sample drift correction for low intensity electron counted TEM images

Thursday, August 1, 2024

10:00 AM - 12:00 PM US EST

Location: Exhibit Hall

Presenting Author(s)

PB

Polina V Burmistrova

Department of Chemistry, York College / CUNY, Jamaica, NY, USA, United States
XQ

Xiaohui Qu

Brookhaven National Laboratory, New York, United States
DN

Dmytro Nykypanchuk

Brookhaven National Laboratory, United States
ML

Meng Li, Ph.D (she/her/hers)

Staff Scientist
Brookhaven National Lab, United States
YS

Yolanda Small

Department of Chemistry, York College / CUNY, Jamaica, NY, USA, United States

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.