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Final Program


Analytical Sciences Symposia

A09.P1 - Automation in Microscopy from Image Acquisition to Image Analysis, Data Visualization, and Management

(122) Aberration Measurement from Crystalline Ronchigrams with an Attention Neural Network

Tuesday, July 30, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • JW

    Jingrui Wei

    Research assistant
    University of wisconsin-madison
    University of wisconsin-madison
    madison, Wisconsin, United States

    • Co-Author(s)

  • Paul M. Voyles (he/him/his)

    Professor
    University of Wisconsin-Madison, Department of Materials Science and Engineering
    University of Wisconsin-Madison, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.