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Final Program


Analytical Sciences Symposia

A11.P1 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

(372) Improving Transmission Kikuchi Diffraction Workflows

Thursday, August 1, 2024
10:00 AM - 12:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • Kim Larsen (he/him/his)

    Product Manager
    Oxford Instruments NanoAnalysis
    High Wycombe, England, United Kingdom

    • Co-Author(s)

  • MH

    Michael Hjelmstad

    Applications Specialist
    Oxford Instruments NanoAnalysis
    Pleasanton, California, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.