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Final Program


Analytical Sciences Symposia

A09.P1 - Automation in Microscopy from Image Acquisition to Image Analysis, Data Visualization, and Management

(126) Complex-Color Darkfield TEM Interfaces for Crystal, Defect, & Strain Analysis

Tuesday, July 30, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • PF

    Phil B. Fraundorf

    Department of Physics & Astronomy
    University of Missouri St. Louis
    St. Louis, Missouri, United States

    • Co-Author(s)

  • KL

    Kevin Linden

    University of Missouri Saint Louis, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.