Analytical Sciences Symposia
A11.P1 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging
Maria Kormacheva (she/her/hers)
Paul Scherrer Institute, Aargau, Switzerland
Arent Kievits
Delft University of Technology, Zuid-Holland, Netherlands
Joakim Reuteler
Federal Institute of Technology Zurich, Zurich, Switzerland
Marre Niessen
Delmic, Zuid-Holland, Netherlands
Sander den Hoedt
CEO
Delmic, Zuid-Holland, Netherlands
Safe Khan
The Francis Crick Institute, England, United Kingdom
Carles Bosch
The Francis Crick Institute, England, United Kingdom
Jacob Hoogenboom
Associate Professor
Delft University of Technology, Zuid-Holland, Netherlands
Andreas Schaefer
The Francis Crick Institute, England, United Kingdom
Adrian Wanner
Paul Scherrer Institute, England, United Kingdom
