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Final Program


Analytical Sciences Symposia

A09.P2 - Automation in Microscopy from Image Acquisition to Image Analysis, Data Visualization, and Management

(246) Denoising of Scanning Electron Microscope Images Acquired at Rapid Frame Rates for Metrology Measurement

Wednesday, July 31, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • HJ

    Haewon Jung

    Korea Research Institute of Standards and Science, Republic of Korea

    • Co-Author(s)

  • HK

    Hoon Kang

    Korea Research Institute of Standards and Science, Republic of Korea

  • HL

    Ha Rim Lee

    Korea Research Institute of Standards and Science, Republic of Korea

  • IP

    In-Yong Park

    Korea Research Institute of Standards and Science
    Daejeon, Republic of Korea


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.