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Final Program


Analytical Sciences Symposia

A03.P1 - Expanding Capabilities of Atom Probe Tomography (IFES-Organized)

(234) Using Voltage-plus-Laser Mode to Characterize the Atom-Probe Field-Evaporation Properties of a Standard Silicon Specimen

Wednesday, July 31, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • TP

    Ty J. Prosa

    Sr. Scientist
    CAMECA Instruments Inc.
    Madison, Wisconsin, United States

    • Co-Author(s)

  • Mh

    Michael holman

    CAMECA Instruments Inc., United States

  • YC

    Yimeng Chen

    Application scientist
    CAMECA Instruments Inc.
    Madison, Wisconsin, United States

  • DR

    David Reinhard

    Product Manager
    CAMECA Instruments Inc.
    Madison, Wisconsin, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.