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Final Program


Analytical Sciences Symposia

A10.P3 - Correlative Analysis and Multimodal Microscopy and Spectroscopy

(262) Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System

Wednesday, July 31, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • Olivier De Castro (he/him/his)

    Research and Technology Associate
    Luxembourg Institute of Science and Technology (LIST)
    University Paris Saclay
    Belvaux, Luxembourg

    • Co-Author(s)

  • HH

    Hung Quang Hoang

    Senior Researcher
    Luxembourg Institute of Science and Technology (LIST)
    Belvaux, Luxembourg

  • OB

    Olivier Bouton

    Electronics engineer
    Luxembourg Institute of Science and Technology (LIST)
    Belvaux, Luxembourg

  • RB

    Rachid Barrahma

    Luxembourg Institute of Science and Technology (LIST), Luxembourg

  • CC

    Chérif Coulbary

    Luxembourg Institute of Science and Technology (LIST), Luxembourg

  • TW

    Tom Wirtz

    Head of unit - 'Scientific Instrumentation and Process Technology'
    Luxembourg Institute of Science and Technology (LIST)
    Belvaux, Luxembourg


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.