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Final Program


Analytical Sciences Symposia

A09.P1 - Automation in Microscopy from Image Acquisition to Image Analysis, Data Visualization, and Management

(127) Estimating Specimen Height Using SEM Working Distance

Tuesday, July 30, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • JY

    Jiwon Yoon

    Samsung Electronics, Seoul-t'ukpyolsi, Republic of Korea


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.