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Final Program


Analytical Sciences Symposia

A08.P2 - New Opportunities in Material Science – Multi-dimensional Imaging and Advanced Data Processing

(111) Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM) for Advance Characterization of Grain Boundaries at the Nanoscale in Copper Bicrystals

Tuesday, July 30, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • TK

    Theresa M. Kucinski, Ph.D. (she/her/hers)

    LANL, United States

    • Co-Author(s)

  • DX

    Dongyue Xie

    LANL, United States

  • NL

    Nan Li

    Research scientist
    LANL, United States

  • BS

    Benjamin Savitzky

    Postdoctoral Research Associate
    Lawrence Berkeley National Laboratory
    (1) , (2)
    Berkeley, California, United States

  • Colin Ophus

    Staff Scientist
    National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
    Lawrence Berkeley National Laboratory
    Berkeley, California, United States

  • MP

    Michael Pettes

    LANL, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.