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Final Program


Physical Sciences Symposia

P10.P1 - In Situ and Cryogenic Electron Microscopy and Spectroscopy for Energy Materials

(97) Damage free 3D characterization and TEM sample preparation of beam sensitive materials using advanced multiple ion source PFIB under cryogenic conditions

Monday, July 29, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • MW

    Min Wu

    Market Development Manager - Chemistry
    Thermo Fisher Scientific
    Eindhoven, Netherlands

    • Co-Author(s)

  • BL

    Brandon Leer

    Sr Product Marketing Manager
    Thermo Fisher Scientific
    Eindhoven, Netherlands

  • HG

    Haifeng Gao

    Thermo Fisher Scientific, China (People's Republic)


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.