Short Courses

X10 - Guidelines for Performing 4D-STEM Characterization from the Atomic to Micrometer Scales: Experimental Considerations, Data Analysis

Session Chair(s)

• DM

  David Muller

  Prof.
  Cornell University
  Ithaca, New York, United States
• 

  Colin Ophus

  Staff Scientist
  National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
  Lawrence Berkeley National Laboratory
  Berkeley, California, United States
• SZ

  Steven Zeltmann

  Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, United States
• DY

  Dasol Yoon (she/her/hers)

  Graduate student
  Cornell University
  Cornell University
  Ithaca, New York, United States
• 

  Chia-Hao Lee

  Graduate Research Assistant
  University of Illinois at Urbana-Champaign
  Urbana, Illinois, United States
• 

  Harikrishnan K. P.

  Graduate student
  School of Applied and Engineering Physics, Cornell University
  Ithaca, NY, United States
• GT

  Geri Topore (he/him/his)

  Imperial College London, United Kingdom
• 

  Georgios Varnavides

  Postdoctoral Fellow
  University of California, Berkeley
  National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Lab
  Berkeley, California, United States
• SR

  Stephanie Ribet

  Lawrence Berkeley National Laboratory, United States
• 

  Benjamin H. Savitzky, PhD

  Postdoctoral Scientist
  h-Bar Instruments
  Pawtucket, Rhode Island, United States