Angstrom Scientific, Inc | Unlocking the Potential of In-Situ Microscopy

The joint vendor tutorial of Alemnis, Imina Technologies, NenoVision, and Point Electronic is an educational program designed to provide an overview of cutting-edge technologies for in-situ material characterization and analysis in SEM. Alemnis specializes in in-situ mechanical testing, offering high-precision tools for testing materials at the nanoscale. Imina Technologies focuses on in-situ electrical nanoprobing, providing tools for electrical measurements on small samples. NenoVision specializes in in-situ AFM-related characterization, offering advanced atomic force microscopy systems for high-resolution topography, electrical, and magnetic imaging and analysis in SEM. Point Electronic offers EM signal acquisition and processing solutions for various applications, including material characterization.