NenoVision | AFM-in-SEM Technology workflow with Litescope

Booth 428

Within the tutorials, we will introduce you AFM-in-SEM LiteScope with patented technology CPEM (Correlative Probe and Electron Microscopy). LiteScope is unique Atomic Force Microscope designed for „plug & play“ integration into the Scanning Electron Microscopes (SEMs). The connection of AFM and SEM merges the strengths of both techniques, resulting in effective workflow and possibilities of complex sample analysis. LiteScope excels in a variety of modes, such as topography, mechanical, electrical, magnetic, or piezoelectric properties useful in a broad range of fields such as material science, semiconductors, life science, and earth science. We will discuss how the technology works, and what are the possible applications for your research.