Sigray | Bridging the Micro- and Nano-Scales with 3D X-Ray Microscopy

Booth 1332

While 3D X-ray microscopy (XRM / micro-CT) has become a workhorse of materials science, life science, and industrial inspection laboratories alike, a length scale gap has existed between high-resolution micro-CT and SEM/TEM that is not well-addressed. While some efforts toward lens-based nano-CT have been introduced, for a variety of applications these lack the penetration & image quality necessary for reliable segmentation (e.g., particle/pore-scale interactions in modern Li-ion batteries). Here, we will introduce Sigray's latest innovations in high-resolution broadband X-ray microscopy, and describe how the system's performance breaks these length-scale barriers and enables next-generation research, with spatial resolutions to below 300 nm.