Bruker AXS / Nion | Latest Developments with Nion Microscopes

Booth 210

Nion's Ultra High Energy Resolution Monochromated EELS-STEM (UHERMES™) has demonstrated 2.6 meV energy resolution at 20 kV primary voltage. This system has resulted in revolutionary new analytical capabilities in the electron microscope, including atomic-resolution phonon spectroscopy, isotopic sensitivity, and phonon dispersion surface mapping. This tutorial will describe the experiments and show recent applications. It will also include a live demonstration of the instrument.