3D-Micromac AG | fs-laser Ablation Based Preparation Methods for High-resolution Materials Characterization

Booth 1724

In this tutorial, Dr. Michael Tkadeltz from the Montan University Leoben (Austria, an experienced microPREP™ PRO FEMTO user, will be talking about his experiences. He shows how the integration of fs-laser ablation systems with focused ion beam (FIB) workstations and broad ion beam (BIB) polishing devices sets new pathways for preparation processes for transmission electron microscopy (TEM) and atom probe tomography (APT). Join this session to learn how modern specimen preparation techniques can significantly reduce complexity, often eliminate the need for FIB lift-outs, optimize materials research workflows, and enhance specimen throughput, paving the way for faster and more efficient investigations. In a live demo session, you will experience the flexibility of laser ablation systems in designing specimen geometries like discs, half-grids, microtip arrays, and whole sample holders.