Featured Symposium

Characterization of Hierarchical Microstructures in TiC Reinforced Nickel Matrix Composites: Fine feature detection in 3D using X-ray Microscopy

Presenting Author(s)

• KY

  Kaushik Yanamandra, PhD (he/him/his)

  Applications Engineer
  Carl Zeiss, United States

Co-Author(s)

• HB

  Hrishikesh Bale

  Solutions Manager-Engineering Materials
  Carl Zeiss
  Dublin, California, United States
• Rb

  Rajarshi banerjee

  University of North Texaa, United States