P09.2 - Advances in In Situ TEM Characterization of Dynamic Processes in Materials

Sponsored By 

Session Chair(s)

• EO

  Eva Olsson
• WJ

  Wolfgang Jaeger

Presentations:

• 10:30 AM - 11:00 AM US EST

  Towards Atomic-Scale Investigation of Resistive Switching in Memristive Systems via MEMS-based In Situ Electron Microscopy
  

  Presenting Author: Leopoldo Molina-Luna, Ph.D. – Advanced Electron Microscopy Division, Institute of Materials Science, TU Darmstadt
• 11:00 AM - 11:15 AM US EST

  In-situ Switching of van der Waals Ferroelectrics with in-plane Electric Biasing
  

  Presenting Author: Xinyan Li (he/him/his) – Rice University

  Co-Author: Chuqiao Shi – Rice University

  Co-Author: Nannan Mao – MIT

  Co-Author: Jing Kong – MIT

  Co-Author: Ramamoorthy Ramesh – Rice University

  Co-Author: Yimo Han – Rice University
• 11:15 AM - 11:30 AM US EST

  Impact of Oxidation Layer in the Resistive Switching Behavior of Nitride-based Memristor Devices
  

  Presenting Author: Di Zhang, Ph.D. – Los Alamos National Laboratory

  Co-Author: Rohan Dhall, Ph.D. – Lawrence Berkerley National Laboratory

  Co-Author: Chengyu Song – Lawrence Berkeley National Laboratory

  Co-Author: Matthew Schneider – Materials Science & Technology Division, Los Alamos National Laboratory

  Co-Author: Stephen House, Ph.D. – Sandia National Laboratories

  Co-Author: Sundar Kunwar, Ph.D. – Los Alamos National Laboratory

  Co-Author: Hongyi Dou, Ph.D. – Purdue University

  Co-Author: Jim Ciston – Lawrence Berkeley National Laboratory

  Co-Author: Haiyan Wang – Purdue University

  Co-Author: Aiping Chen – Los Alamos National Laboratory
• 11:30 AM - 11:45 AM US EST

  Advancing In-Situ Sample Preparation for MEMS-Based Electrical and Electro-Thermal (S)TEM Characterization
  

  Presenting Author: Vesna Srot – Max Planck Institute for Solid State Research

  Co-Author: Rainer Straubinger – Protochips Inc.

  Co-Author: Felicitas Predel – Max Planck Institute for Solid State Research

  Co-Author: Peter A. van Aken – Max Planck Institute for Solid State Research
• 11:45 AM - 12:00 PM US EST

  PFIB and STEM EBIC: A Potent Combination for Operando TEM of Electronic Devices
  

  Presenting Author: William Hubbard, PhD (he/him/his) – NanoElectronic Imaging Inc.

  Co-Author: B. C. Regan – University of California, Los Angeles