A02.2 - Data Science and Atom Probe Tomography (IFES-Organized)

Session Chair(s)

• MK

  Markus Kühbach

Presentations:

• 8:30 AM - 9:00 AM US EST

  Machine Learning Enhanced Tomographic Imaging of Chemical Short-range Order in Fe-based Solid Solutions
  

  Presenting Author: Yue Li, Ph.D (he/him/his) – Max-Planck-Institut für Eisenforschung GmbH

  Co-Author: Baptiste Gault – Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany
• 9:00 AM - 9:15 AM US EST

  How Can 4D-STEM Inform Atom Probe Experiments? Relating Structure and Composition of Multiferroic Oxides at the Atomic Scale
  

  Presenting Author: Geri Topore – Imperial College london

  Co-Author: James Douglas – Imperial College London

  Co-Author: Lynette Keeney – Univerisity College Cork

  Co-Author: Baptiste Gault – Imperial College London

  Co-Author: Shelly Michele Conroy – Department of Materials, London Centre of Nanotechnology, Imperial Henry Royce Institute, Imperial College London
• 9:15 AM - 9:30 AM US EST

  Analyzing Linear Features in Atom Probe Tomography Datasets using Skeletonization
  

  Presenting Author: Alaukik Saxena – Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany

  Co-Author: Markus Kühbach – Physics Department and IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany

  Co-Author: Shyam Katnagallu – Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany

  Co-Author: Paraskevas Kontis – Department of Materials Science and Engineering, Norwegian University of Science and Technology, Trondheim, Norway

  Co-Author: Baptiste Gault – Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany

  Co-Author: Christoph Freysoldt – Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany
• 9:30 AM - 9:45 AM US EST

  Spatial Ranging and Volume Segmentation of Atom Probe Tomography Data
  

  Presenting Author: Robert Ulfig – CAMECA Inc.

  Co-Author: Frederick Meisenkothen – National Institute of Standards and Technology

  Co-Author: David Reinhard – CAMECA Instruments Inc.

  Co-Author: Ed Oltman, Ph.D – CAMECA Instruments Inc.

  Co-Author: David J. Larson, PhD (he/him/his) – CAMECA Inc.