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STEM-in-SEM versus SE-InLens-type-SEM as a Reliable Analytical Pair-Tool for Measurement of Nanoparticle Size and Shape Distribution

Presenting Author(s)

• 

  Vasile-Dan Hodoroaba, Ph.D (he/him/his)

  Head of Division 6.1
  Federal Institute for Materials Research and Testing
  Berlin, Berlin, Germany

Co-Author(s)

• CS

  Christoph Salzmann

  Federal Institute for Materials Research and Testing (BAM), United States
• FP

  Francesco Pellegrino

  Contract Professor
  Department of Chemistry and NIS Centre, University of Torino, Torino, Italy, Italy