A11.1 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Session Chair(s)

• JH

  Jason Holm

  Materials Research Engineer
  NIST
  Boulder, Colorado, United States
• MH

  Milena Hugenschmidt

  Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany
• AE

  Anna Lena Eberle

  Carl Zeiss MultiSEM GmbH
  Oberkochen, Baden-Wurttemberg, Germany

Presentations:

• 10:30 AM - 11:00 AM US EST

  STEM in SEM and Multiple Beam SEM: Past Achievements and Future Prospects
  

  Presenting Author: Joseph Michael, PhD – Retired from Sandia National Laboratories
• 11:00 AM - 11:15 AM US EST

  STEM-in-SEM versus SE-InLens-type-SEM as a Reliable Analytical Pair-Tool for Measurement of Nanoparticle Size and Shape Distribution
  

  Presenting Author: Vasile-Dan Hodoroaba, Ph.D (he/him/his) – Federal Institute for Materials Research and Testing

  Co-Author: Christoph Salzmann – Federal Institute for Materials Research and Testing (BAM)

  Co-Author: Francesco Pellegrino – Department of Chemistry and NIS Centre, University of Torino, Torino, Italy
• 11:15 AM - 11:45 AM US EST

  Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Capabilities for Study of Advanced 2D Materials and Thin Foils
  

  Presenting Author: Ilona Müllerová (she/her/hers) – Institute of Scientific Instruments of the Czech Academy of Sciences

  Co-Author: Ivo Konvalina (he/him/his) – Institute of Scientific Instruments of the Czech Academy of Sciences

  Co-Author: Aleš Paták (he/him/his) – Institute of Scientific Instruments of the Czech Academy of Sciences

  Co-Author: Lukáš Průcha (he/him/his) – Institute of Scientific Instruments of the Czech Academy of Sciences

  Co-Author: Martin Zouhar (he/him/his) – Institute of Scientific Instruments of the Czech Academy of Sciences

  Co-Author: Jakub Piňos (he/him/his) – Institute of Scientific Instruments of the Czech Academy of Sciences

  Co-Author: Eliška Materna Mikmeková (she/her/hers) – Institute of Scientific Instruments of the Czech Academy of Sciences
• 11:45 AM - 12:00 PM US EST

  Towards Atomic-Resolution Electron Energy Loss Spectroscopy in an Uncorrected 30kV Scanning Electron Microscope
  

  Presenting Author: Quentin M. Ramasse – SuperSTEM

  Co-Author: Demie M. Kepaptsoglou – SuperSTEM

  Co-Author: Takeshi Sunaoshi – Hitachi High-Technologies

  Co-Author: Kazutoshi Kaji – Hitachi High-Technologies

  Co-Author: Satoshi Okada – Hitachi High-Technologies

  Co-Author: Yu Yamazawa – Hitachi High-Technologies

  Co-Author: Tsutomu Saito – Hitachi High-Technologies

  Co-Author: Michael Dixon – Hitachi High-Tech Europe

  Co-Author: Feridoon Azough – University of Manchester

  Co-Author: Robert Freer – University of Manchester