A07.3 - Triumphs, Trials, and Trepidations in Quantifying Low-Z Elements with Microanalytical Methods

Sponsored By 

Session Chair(s)

• JB

  Joseph Boro, Ph.D

  Lawrence Livermore National Labs, United States
• ON

  Owen Neill

  Manager, R.B. Mitchell Electron Microbeam Analysis Lab
  University of Michigan
  Ann Arbor, Michigan, United States

Presentations:

• 10:30 AM - 11:00 AM US EST

  Chemical State Analysis of Low-Z Elements by X-ray Photoelectron Spectroscopy (XPS)
  

  Presenting Author: Mark C. Biesinger, PhD – Surface Science Western, Western University
• 11:15 AM - 11:30 AM US EST

  Optimal Energy Dispersive X-ray Microanalysis of Low-Z Elements
  

  Presenting Author: Nicholas Ritchie, PhD – NIST

  Co-Author: Dale E. Newbury, Ph.D. (he/him/his) – Department of Commerce, NIST
• 11:30 AM - 11:45 AM US EST

  Detecting Trace Boron Doped in Tungsten Plates Using ToF-SIMS, Raman, and SEM
  

  Presenting Author: Xiao-Ying Yu – Oak Ridge National Laboratory

  Co-Author: Tim Graening – Oak Ridge National Laboratory

  Co-Author: Guang Yang – Oak Ridge National Laboratory

  Co-Author: Tanguy Terlier – Rice University

  Co-Author: Gabriel Parker – Oak Ridge National Laboratory

  Co-Author: Yutai Katoh – Oak Ridge National Laboratory
• 11:45 AM - 12:00 AM US EST

  Assessing the accuracy of lithium contents determined by combined quantitative backscattered electron and x-ray energy dispersive spectroscopy analysis
  

  Presenting Author: David Stowe – Gatan Inc

  Co-Author: Jonathan Lee – Lockheed Martin

  Co-Author: Rene de Kloe – EDAX

  Co-Author: Julia Mausz – EDAX

  Co-Author: Shangshang Mu, Ph.D. – Gatan/EDAX