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Automated Defect Detection in Atomic Resolution STEM Images: A Machine Learning Approach with Variational Convolutional Autoencoders

Presenting Author(s)

• 

  Raja Abdul Wahab Ayyubi, Ph.D Student (he/him/his)

  University of Illinois at Chicago
  University of Illinois at Chicago
  Chicago, IL, United States

Co-Author(s)

• jB

  james Buban, Ph.D ; Research Assistant Professor

  University of Illinois at Chicago
  Chicago, Illinois, United States
• 

  Robert Klie, Ph.D

  Professor
  University of Illinois Chicago
  University of Illinois - Chicago
  Chicago, Illinois, United States