Featured Symposium

In-situ AFM-SEM-EDS, a Correlative Microscopy Platform for Surface Characterization and Elemental Analysis

Presenting Author(s)

• 

  Kerim Arat, PhD

  Quantum Design Inc.
  San Diego, CA, United States

Co-Author(s)

• JD

  Jost Diederichs, Ph.D.

  Quantum Design Inc., United States
• BC

  Brent Colvin

  Quantum Design Inc., United States
• AA

  Andreas Amann, Ph.D.

  Quantum Design Inc., United States
• SK

  Sid Kusunoki

  Quantum Design Inc., United States
• HF

  Hajo Frerichs, Ph.D.

  Application Specialist
  Quantum Design Microscopy GmbH, United States
• 

  Chistian Schwalb, Ph.D.

  COO
  Quantum Design Microscopy GmbH, United States
• SS

  Sebastian Siebert, Ph.D.

  Quantum Design Microscopy GmbH, United States
• WN

  William Neils, Ph.D.

  Quantum Design Inc., United States
• ss

  stefano spagna, Ph.D.

  Quantum Design Inc.
  San Diego, California, United States