The FIB FIG is a community of MSA members with a common interest in focused ion beam technologies. We provide a platform for the dissemination of FIB-relevant information and sharing ideas and enthusiasm about FIB-relevant information chosen by our members. Our mission is to promote further development of FIB technology and professionals working with multiple charged particle beam systems.
The range across scientific disciplines from materials science to life sciences. Our members have expertise with gallium, plasma and helium ion species. This FIG offers a framework for the critical exchange of ideas in a broad range of microscopy techniques that spans TEM lamella, 3D FIB-tomograms, lithography, nanomachining, segmentation of collected data, and low temperature methods.
