The Atom Probe Focused Interest Group (AP FIG) is a community of Microscopy Society of America (MSA) members with common interest in atom probe tomography (APT) and field ion microscopy (FIM) techniques for materials characterization. We are also promoting standards as related to APT. Our goal is to provide a forum for the exchange and discussion of information relevant to the membership. In addition to sponsoring other events, we host an annual business meeting and luncheon during the annual Microscopy & Microanalysis (M&M) conference.
