Featured Symposium

Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging

Presenting Author(s)

• 

  Akshay Agarwal (he/him/his)

  Boston University
  JERSEY CITY, NJ, United States

Co-Author(s)

• LK

  Leila Kasaei

  Rutgers University, United States
• XH

  Xinglin He

  Boston University, United States
• OH

  Oguz Kagan Hitit

  Research Assistant
  Boston University
  (1) Koç University
  Afyonkarahisar, Afyonkarahisar, United States
• RK

  Ruangrawee Kitichotkul

  Boston University, United States
• AS

  Albert Schultz

  Ionwerks Inc., United States
• LF

  Leonard Feldman

  Rutgers University, United States
• 

  Vivek Goyal

  Professor
  Boston University
  Boston University
  Boston, Massachusetts, United States