A11.5 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Session Chair(s)

• JH

  Jason Holm

  Materials Research Engineer
  NIST
  Boulder, Colorado, United States
• MH

  Milena Hugenschmidt

  Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany
• AE

  Anna Lena Eberle

  Carl Zeiss MultiSEM GmbH
  Oberkochen, Baden-Wurttemberg, Germany

Presentations:

• 3:30 PM - 4:00 PM US EST

  Low Voltage Scanning Transmission Electron Microscopy as a Viable Tool for Routine Analysis of Materials Science Specimens
  

  Presenting Author: Nicolas Brodusch – McGill University

  Co-Author: Raynald Gauvin – McGill University
• 4:00 PM - 4:15 PM US EST

  TSEM-EDS Study of Nanoprecipitates in Oxide-Dispersion-Strengthened (ODS) 14YWT Ferritic Alloys
  

  Presenting Author: Tugce Uz (she/her/hers) – Case Western Reserve University

  Co-Author: Jeffrey S. Pigott, Ph.D (he/him/his) – Case Western Reserve University

  Co-Author: Jerard Gordon – University of Michigan

  Co-Author: Buhari Ibrahim – University of Michigan

  Co-Author: Jennifer Carter, Ph.D (she/her/hers) – Case Western Reserve University
• 4:15 PM - 4:30 PM US EST

  Closing the Gap in Electron Detection Capabilities between SEM and TEM
  

  Presenting Author: Maximilian Schmid (he/him/his) – PNDetector GmbH

  Co-Author: Mozhdeh Abbasi – PNDetector GmbH

  Co-Author: Adam Meisel – PNDetector GmbH

  Co-Author: Yassine El Imari (he/him/his) – PNDetector GmbH

  Co-Author: Alessia Mafodda – PNDetector GmbH

  Co-Author: Stefan Aschauer (he/him/his) – PNDetector GmbH
• 4:30 PM - 4:45 PM US EST

  Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
  

  Presenting Author: Kayleigh Harvey, Ph.D. (she/her/hers) – JEOL USA

  Co-Author: Noriyuki Inoue, Ph.D. – JEOL Ltd.

  Co-Author: Sarah Penniston-Dorland, Ph.D. – University of Maryland