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Final Program


Featured Symposium

Analytical Sciences Symposia

A11.5 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Low Voltage Scanning Transmission Electron Microscopy as a Viable Tool for Routine Analysis of Materials Science Specimens

Thursday, August 1, 2024
3:30 PM - 4:00 PM US EST
Location: 19

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • NB

    Nicolas Brodusch

    Research Assistant
    McGill University
    McGill University
    Montreal, QC, Canada

    • Co-Author(s)

  • Raynald Gauvin

    Professor
    McGill University
    McGill University
    Montreal, Quebec, Canada