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Final Program


Featured Symposium

Analytical Sciences Symposia

A05.1 - Microscopy and Microanalysis in Cultural Heritage Studies

A Nondestructive Method for Probing Layer Thicknesses in Early Photographs from Micrometers to Nanometers Using SEM-based μXRF Spectrometry

Thursday, August 1, 2024
2:00 PM - 2:15 PM US EST
Location: 14

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • EV

    Edward P. Vicenzi, Ph.D. (he/him/his)

    Research Scientist
    Smithsonian Institution
    (2) NIST, Material Measurement Laboratory
    Suitland, Maryland, United States

    • Co-Author(s)

  • TL

    Thomas Lam, Ph.D.

    Physical Scientist
    Smithsonian Institution
    Suitland, Maryland, United States

  • RW

    Rachel Wetzel

    Library of Congress, District of Columbia, United States

  • SP

    Shannon Perich

    National Museum of American History, District of Columbia, United States