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Final Program


Featured Symposium

Analytical Sciences Symposia

A06.3 - Electronic and Thermal Device Characterization with Electron Microscopy

Measurement of electrostatic potentials in semiconductor devices by off-axis electron holography.

Thursday, August 1, 2024
1:30 PM - 2:00 PM US EST
Location: 11

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • DC

    David Cooper

    Senior Staff Scientist
    Univ. Grenoble Alpes, CEA LETI
    Grenoble, France

    • Co-Author(s)

  • VB

    Victor Boureau

    EPFL, Switzerland