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Final Program


Featured Symposium

Analytical Sciences Symposia

A10.9 - Correlative Analysis and Multimodal Microscopy and Spectroscopy

Characterization of dislocations in GaN wafers using correlative microscopy: A Raman-SEM-EDS and AFM study

Thursday, August 1, 2024
1:30 PM - 1:45 PM US EST
Location: 3

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.