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Final Program


Featured Symposium

Analytical Sciences Symposia

A08.4 - New Opportunities in Material Science – Multi-dimensional Imaging and Advanced Data Processing

Improving Robustness of Electron Ptychography by Bayesian Optimization of Tilt and Thickness

Tuesday, July 30, 2024
2:15 PM - 2:30 PM US EST
Location: 19

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • DY

    Dasol Yoon (she/her/hers)

    Graduate student
    Cornell University
    Cornell University
    Ithaca, New York, United States

    • Co-Author(s)

  • DM

    David A. Muller

    Professor
    School of Applied and Engineering Physics, Cornell University
    (2) Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY USA
    Ithaca, New York, United States