Skip to main content
M&M 2024 Meeting (Microscopy & Microanalysis) Main banner
Final Program


Featured Symposium

Cross-Disciplinary Symposia

C04.1 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

Development of Automatic Cross-Sectional Scanning-Electron-Microscope-Observation Technique using Image Recognition of Semiconductor-Devices Structure

Thursday, August 1, 2024
9:30 AM - 9:45 AM US EST
Location: 1

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.