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Final Program


Featured Symposium

Cross-Disciplinary Symposia

C04.1 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

Dynamic STEM-EELS of atom and defect evolution during electron beam transformations

Thursday, August 1, 2024
9:00 AM - 9:15 AM US EST
Location: 1

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.