A11.3 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Session Chair(s)

• MH

  Milena Hugenschmidt

  Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany

Presentations:

• 8:30 AM - 9:00 AM US EST

  4D STEM-in-SEM, Fleeting Fancy or Foundation for the Future
  

  Presenting Author: Jason Holm, Ph.D – NIST
• 9:00 AM - 9:15 AM US EST

  4D STEM in SEM with a Fast Pixelated Direct Detector
  

  Presenting Author: Martin Huth (he/him/his) – PNDetector GmbH

  Co-Author: Björn Eckert – PNDetector GmbH

  Co-Author: Petra Majewski – PNDetector GmbH

  Co-Author: Stefan Aschauer – PNDetector GmbH

  Co-Author: Lothar Strüder – PNSensor GmbH

  Co-Author: Heike Soltau – PNDetector GmbH
• 9:15 AM - 9:30 AM US EST

  CANCELLED: An Investigation on 3D Electron Diffraction and 4-Dimensional Scanning Diffraction Tomography Using a Scanning Electron Microscope
  

  Presenting Author: Saleh Gholam (he/him/his) – University of Antwerp

  Co-Author: Nikita Denisov (he/him/his) – University of Antwerp

  Co-Author: Andrey Orekhov (he/him/his) – University of Antwerp

  Co-Author: Johan Verbeeck (he/him/his) – University of Antwerp

  Co-Author: Joke Hadermann (she/her/hers) – University of Antwerp
• 9:30 AM - 9:45 AM US EST

  Transmission Electron Imaging and Diffraction of Asbestos Fibers in an SEM
  

  Presenting Author: Jason Holm – NIST

  Co-Author: Elisabeth Mansfield – NIST