Skip to main content
M&M 2024 Meeting (Microscopy & Microanalysis) Main banner
Final Program


Featured Symposium

Analytical Sciences Symposia

A11.2 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Rapid Chip Reverse Engineering Using Laser, FIB, and SEM

Wednesday, July 31, 2024
2:45 PM - 3:00 PM US EST
Location: 19

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.