Bruker | Soft X-ray Analysis with Bruker XSense WD- spectrometer

Booth 922

Wavelength Dispersive Spectrometry (WDS) is a complementary analytical technique to EDS (Electron Dispersive Spectrometry) for SEM’s. While EDS is the standard analytical tool on a SEM and best suited for everyday use, it is limited in spectral resolution and detection sensitivity. Wavelength Dispersive Spectrometry overcomes these limits, allowing to separate peaks even at low concentration levels which cannot be separated by classical EDS.

Commercially available Wavelength Dispersive Spectrometers are built using different design approaches, and hence resulting in different analytical performance levels. The Bruker XSense WDS works with an X-ray collection optic, allowing to capture the X-rays very close to the sample of origin. Hence, count rates for soft X-rays registered by the XSense are much higher than any standard EDS detector or conventional Wavelength Dispersive Spectrometers.

We will discuss the technical principles of the XSense WDS, parallel-beam optic (PBO) based and will demonstrate its outstanding analytical capabilities for analyzing soft X-rays for various applications.”