TESCAN | Boosting performance and productivity of multimodal analytical STEM by using 100 kV

Booth 521

Nanoscale characterization by scanning transmission electron microscopy (STEM) is driven by ever increasing compositional and structural complexity of new and improved materials in a wide range of applications and industries. The groundbreaking new approach to multimodal analytical STEM characterization introduced with TESCAN TENSOR, including the advanced electron diffraction techniques enhanced by beam precession, makes precise analyses of morphological, chemical, and structural properties accessible to a wide range of users and scientists. The unique new design of TESCAN TENSOR has enabled advanced on-the-fly automation of system alignments and adjustments of STEM imaging, STEM analysis and 4D-STEM nanobeam settings without user intervention. The combination of 100 kV FEG electron probe with fast beam precession (72,000 Hz) and sensitive detectors (Dectris Quadro) provide interactive sample analysis and assure high quality of recorded data per electron dose. Full integration and synchronization of all microscope modules facilitate simplified workflows, which ultimately translate into fast time to data and superior productivity.