Post-Doctoral Fellow
National Institute of Standards and Technology
Gaithersburt, Maryland, United States
Karen DeRocher is currently a Postdoctoral Research Associate in the Materials Measurement Science Division at the National Institute of Standards and Technology. She graduated from Iowa State University with a B.S. in Materials Engineering in 2013. She obtained her Ph.D. in Materials Science and ENgineering from Northwestern University in 2020. Her doctoral research centered around investigating the nano-scale chemical gradients in human enamel crystallites, and how those gradients may affect the chemical and mechanical properties of enamel. Karen joined NIST in 2021, and her current research focuses on the accurate quantification of dopants in semiconductor materials using atom probe tomography.
Ranging Atom Probe Spectra to Reduce Measurement Bias
Tuesday, July 30, 2024
11:15 AM - 11:30 AM US EST
