TOFWERK
Thun, Bern, Switzerland
Over 20 years experience of mass spectrometry and instrument development in academic and commercial environments. Deputy product manager for TOFWERK's 'fibTOF' FIB-SIMS product - a mass analyzer that converts a FIB-SEM microscope to a secondary ion mass spectrometer, capable of nanometer-scale chemical imaging of minor elements.
The Value of Light Element Imaging Using FIB-SIMS for Material Characterization at Nanometer Scales.
Wednesday, July 31, 2024
9:15 AM - 9:30 AM US EST
