Vendor Tutorials

Presentations:

• 5:45 PM - 6:45 PM US EST

  Angstrom Scientific, Inc | Unlocking the Potential of In-Situ Microscopy
• 5:45 PM - 6:45 PM US EST

  Clark-MXR, Inc. | Turnkey Micromachining Today
• 5:45 PM - 6:45 PM US EST

  DECTRIS Ltd. | New Applications Exploring Fast 4D STEM with ARINA
• 5:45 PM - 6:45 PM US EST

  Euclid Techlabs | Key Attributes to Consider when Choosing a UEM System
• 5:45 PM - 6:45 PM US EST

  Gatan/EDAX | Powerful Python processing in DigitalMicrograph
• 5:45 PM - 6:45 PM US EST

  h-Bar Instruments | Chalk Talk: thermal losses in in-situ cooling TEM - OR - what's the temp at the tip?
• 5:45 PM - 6:45 PM US EST

  Hitachi High-Tech America, Inc.| New Approaches to Analytical STEM: Atomic Resolution EELS in a 30kV SEM
• 5:45 PM - 6:45 PM US EST

  JEOL | Introduction to the JEM-120i
• 5:45 PM - 6:45 PM US EST

  Kitware | trame: An Open Source Framework for Efficiently Building Interactive Visualization and Analysis Applications
• 5:45 PM - 6:45 PM US EST

  Linkam Scientific Instruments Limited | Automated tools for the freezing and screening of your cryo-samples with CryoGenium and CMS196V4
• 5:45 PM - 6:45 PM US EST

  MIPAR | MIPAR Spotlight: Integrating Zero-Shot, Deep Learning, and Conventional Processing for Advanced Micrograph Analysis
• 5:45 PM - 6:45 PM US EST

  MiTeGen | Easy and Efficient Cryo-EM Grid Clipping With The Grid Clipping Station
• 5:45 PM - 6:45 PM US EST

  Oxford Instruments | Unity: Making Imaging Elementary
• 5:45 PM - 6:45 PM US EST

  QUANTUM DESIGN | FusionScope: AFM-SEM Correlative Microscopy Imaging System
• 5:45 PM - 6:45 PM US EST

  Sigray | Bridging the Micro- and Nano-Scales with 3D X-Ray Microscopy
• 5:45 PM - 6:45 PM US EST

  TESCAN | AI-Assisted TEM Lamella Prep Automation with Automated Lift-out