C03.4 - Interdisciplinary Analysis of Soft/Hybrid/Bio Materials Using Advanced Focused Ion Beam Methods and Multimodal Microscopy Techniques

Session Chair(s)

• 

  Robert Hovden

  Professor
  Department of Materials Science & Engineering
  University of Michigan
  Ann Arbor, Michigan, United States

Presentations:

• 3:30 PM - 4:00 PM US EST

  CANCELLED: Enabling New Science with Atom Probe Tomography via Environmentally Protected Specimen Handling
  

  Presenting Author: Daniel E. Perea, Ph.D. (he/him/his) – Pacific Northwest National Laboratory (PNNL)
• 4:00 PM - 4:15 PM US EST

  Cryo STEM of Low Melting Point Metals Enabled by Cryo FIB and EXLO
  

  Presenting Author: Michael Colletta – Cornell University

  Co-Author: Jamie Ford – Nanoscale Characterization Facility, University of Pennsylvania

  Co-Author: Joseph Michael – Sandia National Laboratories (Ret.)

  Co-Author: Lucille Giannuzzi – EXpressLO LLC

  Co-Author: David A. Muller – School of Applied and Engineering Physics, Cornell University
• 4:15 PM - 4:30 PM US EST

  CANCELLED: Effect of single-layer graphene substrate on mitigating the electron beam induced damage in ZIF-8 Metal-organic-framework (MOF)
  

  Presenting Author: Sara Talebi Deylamani – DTU Nanolab, Technical University of Denmark (DTU), Lyngby, Denmark

  Co-Author: Pritam Banerjee – DTU Nanolab, Technical University of Denmark (DTU), Lyngby, Denmark

  Co-Author: Kathrin L. L. Kollmannsberger – Catalysis Research Centre and Department of Chemistry, Technical University of Munich, Lichtenbergstr. 4, D- 85748 Garching, Germany

  Co-Author: Roland A. A. Fischer – Catalysis Research Centre and Department of Chemistry, Technical University of Munich, Lichtenbergstr. 4, D- 85748 Garching, Germany

  Co-Author: Joerg R. Jinschek – DTU Nanolab, Technical University of Denmark (DTU), Lyngby, Denmark
• 4:30 PM - 4:45 PM US EST

  Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging
  

  Presenting Author: Akshay Agarwal (he/him/his)

  Co-Author: Leila Kasaei – Rutgers University

  Co-Author: Xinglin He – Boston University

  Co-Author: Oguz Kagan Hitit – Boston University

  Co-Author: Ruangrawee Kitichotkul – Boston University

  Co-Author: Albert Schultz – Ionwerks Inc.

  Co-Author: Leonard Feldman – Rutgers University

  Co-Author: Vivek Goyal – Boston University
• 4:45 PM - 5:00 PM US EST

  Damage Diffusion Model in Scanning Transmission Electron Microscopy
  

  Presenting Author: Alex Robinson – SenseAI Innovations Ltd.

  Author: Amirafshar Moshtaghpour, Ph. D – Rosalind Franklin Institute

  Co-Author: Abner Velazco-Torrejon – The Rosalind Franklin Institute

  Co-Author: Daniel Nicholls – SenseAI Innovations Ltd.

  Co-Author: Nigel D. Browning – University of Liverpool

  Co-Author: Professor I. Kirkland – Rosalind Franklin Institute