A11.4 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Session Chair(s)

• JH

  Jason Holm

  Materials Research Engineer
  NIST
  Boulder, Colorado, United States

Presentations:

• 1:30 PM - 2:00 PM US EST

  Ongoing International Interlaboratory Comparisons on Size, Shape and (Relative) Concentration of Complex Nanoparticles under the Pre-Standardization Platform of VAMAS
  

  Presenting Author: Vasile-Dan Hodoroaba, Ph.D (he/him/his) – Federal Institute for Materials Research and Testing

  Co-Author: Christoph Salzmann – Federal Institute for Materials Research and Testing (BAM)

  Co-Author: Maria Heilmann – Federal Institute for Materials Research and Testing (BAM)

  Co-Author: Francesco Pellegrino – Department of Chemistry and NIS Centre, University of Torino, Torino, Italy

  Co-Author: Bénédicte Durand – Université Paris Saclay, CEA, CNRS, NIMBE, Gif-sur-Yvette, France

  Co-Author: Olivier Taché – Université Paris Saclay, CEA, CNRS, NIMBE, Gif-sur-Yvette, France

  Co-Author: Amaia Zurutuza – Graphenea Semiconductor SLU, San Sebastián, Spain
• 2:00 PM - 2:15 PM US EST

  Visualizing the Point-Spread Function of the SEM Optics
  

  Presenting Author: Surya Kamal (he/him/his) – Rochester Institute of Technology

  Co-Author: Richard Hailstone – Rochester Institute of Technology
• 2:15 PM - 2:30 PM US EST

  Inelastic and elastic scattering cross-sections for carbon at 20-30 keV
  

  Presenting Author: Cristina Cordoba, Ph.D (she/her/hers) – Centre for Advanced Materials and Related Technologies and Department of Physics and Astronomy, University of Victoria

  Co-Author: Nicolas Brodusch – McGill University

  Co-Author: Robert McLeod, Ph.D – Hitachi High Tech Canada, Inc., Nano Accessories Product Group, Etobicoke ON, Canada

  Co-Author: Raynald Gauvin – McGill University

  Co-Author: Arthur M. Blackburn, Ph.D (he/him/his) – Centre for Advanced Materials and Related Technologies and Department of Physics and Astronomy, University of Victoria
• 2:30 PM - 2:45 PM US EST

  Unified Approach to Standards-Based Absolute Quantification of EDX and EEL Spectra of Nanoscale Materials in STEM and STEM-in-SEM
  

  Presenting Author: Vladimir Oleshko, Ph.D. (he/him/his) – NIST

  Co-Author: Nicholas Ritchie, PhD – NIST

  Co-Author: Andrew Herzing, Ph. D. – NIST