Ritvij Chandrakar (he/him/his)

Materials engineering department, McGill university, Canada

Poster(s):

• (370) High-Resolution Imaging and X-Ray Microanalysis of Oxide at Low Energy using Scanning Electron Microscope and Triple Beam FIB Microscope.
  Thursday, August 1, 2024

  10:00 AM - 12:00 PM US EST