Hitachi High-Tech Corporation, Japan
Toshie Yaguchi is an application engineer of electron microscopy at Hitachi High-Tech Corporation.
Her work focuses on the development of in-situ TEM observation technique, especially for the energy related materials. She edited the journal ‘Microscopy’ Volume 73 Number 2 special issue of 'In-situ observation study for electron microscope', published this year as a guest editor. There is also a review article ‘In-situ TEM study from the perspective of holders’ that includes her work so far.
