Oscar Recalde

PhD student
Advanced Electron Microscopy, TU Darmstadt
TU Darmstadt
Darmstadt, Hessen, Germany

Presentation(s):

• In Situ TEM Investigation of Conductive Bridge RAM devices

  Monday, July 29, 2024
  1:30 PM - 1:45 PM US EST

• Atomic-Scale analysis of Dislocation-Controlled Domain Nucleation and Domain-Wall Pinning in Single-Crystal BaTiO3 by Cryo/Heating MEMS-Based In Situ TEM

  Monday, July 29, 2024
  2:45 PM - 3:00 PM US EST